Atomic force microscopy (AFM) probe

Atomic force microscopy probes are regularly used to characterize surfaces at the nanoscale. One of the most common designs consists of a sharp tip at the end of a bendable cantilever connected to a massive chunk of silicon (the massive chunk of silicon is to make handling easy).
This model is a scale model of one of such probes to assist during demonstrations. The cantilever should be flexible enough to demonstrate bending and resonance, and the tip is sharp enough to show the main issues found while scanning (e.g. misrepresentation of steep edges).
The model is loosely based on commercial probe designs, keeping the aspect ratio but without trying to match the geometrical features of a specific commercial probe.